Title :
Exploiting idle resources for reducing SER of microprocessor functional units
Author :
Sun, Yan ; Li, Shaoqing ; Zhang, Minxuan ; Song, Chao
Author_Institution :
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Soft errors in combinational logic are becoming a serious problem for VLSI design. This paper presents an idle resources based SER reduction scheme for functional units of microprocessors. By exploiting unoccupied hardware and slack time in functional units, this technique reduces overheads of fault tolerance greatly. We combine C-element based error correction techniques with idle resources exploiting to enhance fault tolerance capability of functional units. The experiment results show that 94.36% of injected SETs can be corrected by proposed soft error correction scheme in average, while overheads of fault tolerance are significant low because idle resources are exploited adequately.
Keywords :
VLSI; fault tolerant computing; integrated circuit design; integrated circuit reliability; microprocessor chips; C-element based error correction techniques; SER reduction scheme; VLSI design; combinational logic; fault tolerance; idle resources; microprocessor functional units; soft error correction scheme; Circuits; Clocks; Error analysis; Error correction; Error correction codes; Fault tolerance; Frequency; Logic; Microprocessors; Very large scale integration; functional unit; idle resource; reliability; soft error rate (SER);
Conference_Titel :
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6347-3
DOI :
10.1109/ICCET.2010.5485453