• DocumentCode
    518211
  • Title

    Research of Hopfield network & simulated annealing on micro-drill´s roundness error measurement

  • Author

    Wen-Jiang, Xiang ; Dong-Yuan, Ge ; Ming-Qi, Yu

  • Author_Institution
    Dept. of Mech. & Energy Eng., Univ. of Shaoyang, Shaoyang, China
  • Volume
    3
  • fYear
    2010
  • fDate
    16-18 April 2010
  • Abstract
    While the roundness error of micro-drill margins is measured, the special structure´s Hopfield neural network is designed according to normal equation obtained by pseudo-inverse. The network has 5 neurons, the weights of which are elements of normal equation´s symmetry matrix, the inputs vector of which is composed of numeral value of normal equation´s right. At the same time, via simulated annealing algorithm, iteration is carried out in the light of Metropolis criterion, and the probability of convergence to global optical solution is 1 while the present temperature approaching to desired lease value. Thus the global optimization solution is obtained, which can be taken as coefficient of fitted ellipse, and the roundness error of micro-drill margins can be solved.
  • Keywords
    Hopfield neural nets; drilling; drilling machines; iterative methods; measurement errors; printed circuit manufacture; production engineering computing; simulated annealing; Hopfield neural network; iteration method; microdrill margins; normal equation symmetry matrix; roundness error measurement; simulated annealing; Automotive engineering; Circuit testing; Electronic mail; Energy measurement; Equations; Hopfield neural networks; Mechanical variables measurement; Neurons; Simulated annealing; System testing; Global convergence; Hopfield neural network; Micro-drill; Objective function; Simulated annealing; States vector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-6347-3
  • Type

    conf

  • DOI
    10.1109/ICCET.2010.5485853
  • Filename
    5485853