Title :
Dark Count Impact for First Photon Discriminators for SPAD Digital Arrays in PET
Author :
Tetrault, Marc-Andre ; Therrien, Audrey C. ; Lamy, Etienne Desaulniers ; Boisvert, Alexandre ; Fontaine, Rejean ; Pratte, Jean-Francois
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. de Sherbrooke, Sherbrooke, QC, Canada
Abstract :
To increase contrast in positron emission tomography (PET) images, researchers are investigating detectors that reach below the nanosecond timing resolution. This allows a tight coincidence window which reduces random coincidence counts in the acquired data, as well as to include time-of-flight information into the reconstruction algorithms. With this goal in mind, single photon avalanche diode (SPAD) arrays have been under study for their excellent timing performances. However, their spurious dark counts can blur the start of PET signals where timing information is the most precise and create false starts in the acquisition system, introducing dead time. To minimize these problems in digital SPAD systems using a single time to digital converter (TDC) per PET channel, dark count discriminator circuits are required to reduce timing errors and increase the triggering efficiency in presence of dark counts. This paper compares the performance of a probabilistic and a novel delay line based dark count discriminator. Simulations of a SPAD array investigate the impact of dark counts on triggering efficiency and coincidence timing. Results show that the probabilistic discriminator provides excellent event recovery with regard to dark counts at the cost of some coincidence timing resolution. On the other hand, the delay line discriminator maintains the peak coincidence timing resolution but does not provide as much efficiency at high dark count rate levels.
Keywords :
avalanche photodiodes; biomedical equipment; coincidence techniques; positron emission tomography; readout electronics; time-digital conversion; PET image contrast; SPAD digital arrays; coincidence timing; coincidence window; dark count discriminator circuits; dark count effects; dead time; delay line discriminator; digital SPAD systems; false starts; first photon discriminators; nanosecond timing resolution; positron emission tomography; probabilistic delay line based dark count discriminator; random coincidence count reduction; reconstruction algorithm; single photon avalanche diode; spurious dark counts; time of flight information; time to digital converter; triggering efficiency; Data acquisition; Delay lines; Delays; Photonics; Positron emission tomography; Probabilistic logic; CMOS; dark count rate; digital readout; first photon discriminator; integrated circuits; photodetector; positron emission tomography (PET); scintillation detector; single photon avalanche diode (SPAD); time-of-flight; timing resolution;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2420795