• DocumentCode
    518551
  • Title

    Roll-to-roll hot embossing of microstructures

  • Author

    Velten, Thomas ; Bauerfeld, Frank ; Schuck, Herbert ; Scherbaum, Sabine ; Landesberger, Christof ; Bock, Karlheinz

  • Author_Institution
    Fraunhofer Inst. for Biomed. Eng. (IBMT), St. Ingbert, Germany
  • fYear
    2010
  • fDate
    5-7 May 2010
  • Firstpage
    326
  • Lastpage
    331
  • Abstract
    In this paper we present a new roll-to-roll embossing process allowing the replication of micro patterns with feature sizes down to 0.5 μm. The embossing process is suitable for the continuous output of micro patterned structures and is not accompanied by waste produced during the initial hot embossing phase. This is due to the fact that the foil is not moved during the time needed to reach a thermal steady state. A new type of embossing master is used which is based on flexible silicon substrates. The embossing pattern with sub-μm topographic resolution is prepared on silicon wafers by state of the art lithography and dry etching techniques. The wafers are thinned down to a thickness of 40 μm, which guarantees the mechanical flexibility of the embossing masters. Up to 20 individual chips with a size of 20 × 20 mm2 were assembled on a roller. Embossing experiments with COC foils showed a good replication of the silicon master structures in the foil. The maximum depth of the embossed holes was about 70% of the master height.
  • Keywords
    embossing; etching; lithography; wafer level packaging; art lithography; dry etching; embossing master; flexible silicon substrates; micropattern replication; micropatterned structures; microstructures; roll-to-roll hot embossing; silicon wafers; sub-μm topographic resolution; thermal steady state; Cells (biology); Dry etching; Embossing; Lithography; Manufacturing; Microfluidics; Microstructure; Polymers; Silicon; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Test Integration and Packaging of MEMS/MOEMS (DTIP), 2010 Symposium on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4244-6636-8
  • Electronic_ISBN
    978-2-35500-011-9
  • Type

    conf

  • Filename
    5486475