DocumentCode :
518577
Title :
Wafer-level glass capping with optical integration
Author :
Hansen, U. ; Maus, S. ; Leib, J. ; Toepper, M.
Author_Institution :
MSG Lithoglas AG, Berlin, Germany
fYear :
2010
fDate :
5-7 May 2010
Firstpage :
237
Lastpage :
241
Abstract :
A previously described wafer-level packaging (WLP) process allows quasi-hermetic capping of optical devices on wafer level yielding miniaturized glass cavity windows on top of the optical area - at the same time leaving the contact area accessible for standard electrical connections i.e. wire bond. This paper will focus on advancements in integrating coatings, apertures and three-dimensional lens-structures to achieve a functional integration of a packaging technology with optical qualities. The elevated requirements on the used technologies are discussed and shown on a manufactured demonstrator.
Keywords :
electronics packaging; optical devices; optical integration; packaging technology; quasi-hermetic capping; standard electrical connections; wafer level yielding miniaturized glass cavity windows; wafer-level glass capping; wafer-level packaging; Apertures; Coatings; Contacts; Glass; Integrated optics; Optical devices; Wafer bonding; Wafer scale integration; Windows; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Test Integration and Packaging of MEMS/MOEMS (DTIP), 2010 Symposium on
Conference_Location :
Seville
Print_ISBN :
978-1-4244-6636-8
Electronic_ISBN :
978-2-35500-011-9
Type :
conf
Filename :
5486509
Link To Document :
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