• DocumentCode
    51890
  • Title

    Analytical and Experimental Study of Wide Tuning Range mm-Wave CMOS LC-VCOs

  • Author

    Elabd, S. ; Balasubramanian, S. ; Wu, Qingyao ; Quach, T. ; Mattamana, A. ; Khalil, Waleed

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1343
  • Lastpage
    1354
  • Abstract
    The unprecedented interest in high bandwidth applications in the mm-wave range has set off a wave of research exploring techniques that enable wide tuning range voltage-controlled oscillators (VCOs). Low frequency CMOS LC-VCOs ( <;10 GHz) have been well studied in the literature and several approaches have been developed to optimize their performance. However, there lie several interesting challenges in the mm-wave space, specifically close to the fT/fmax, that motivate the need for analyzing the tuning range and phase noise in mm-wave VCOs. This paper presents a detailed analysis of the ultimate performance bound in simultaneously achieving low phase noise and wide tuning range in CMOS VCOs. The analysis is conducted on a 130 nm CMOS process, and confirmed by measurement results on three VCOs at 26 GHz, 34 GHz and 40 GHz. Finally, the impact of CMOS technology scaling (from 130 nm down to 45 nm), on the achievable performance bounds is analyzed and presented.
  • Keywords
    CMOS analogue integrated circuits; field effect MIMIC; millimetre wave oscillators; phase noise; voltage-controlled oscillators; frequency 26 GHz; frequency 34 GHz; frequency 40 GHz; low phase noise; size 130 nm; ultimate performance bound analysis; voltage-controlled oscillators; wide tuning range mm-wave CMOS LC-VCOs; CMOS integrated circuits; Capacitance; Inductors; Switches; Tuning; Varactors; Voltage-controlled oscillators; CMOS; LC-VCOs; mm-Wave VCOs; technology scaling; tuning range analysis; varactors; wide tuning range;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2014.2309862
  • Filename
    6778105