• DocumentCode
    519102
  • Title

    High voltage SF6 circuit breaker modeling for capacitor bank controlled switching simulation

  • Author

    Chompusri, Yotaka ; Kleesuwan, Srawut ; Charbkaew, Noppadol ; Bunyagul, Teratam

  • Author_Institution
    Dept. of Instrum. & Electron. Eng., King Mongkut´´s Univ. of Technol. North Bangkok, Bangkok, Thailand
  • fYear
    2010
  • fDate
    19-21 May 2010
  • Firstpage
    464
  • Lastpage
    467
  • Abstract
    The controlled switching technology gives the best performance for capacitor bank energization. The development of its adaptive algorithm requires circuit breaker modeling in computer simulation. A normal circuit breaker in EMTP simulation program does not concern with the pre-arcing of circuit breaker. The pre-arcing is a phenomenon which causes the circuit breaker to conduct current before touching of its contacts. This pays important role in capacitor bank energizing control. The model is designed with the adjust ability of rate of decrease of dielectric strength (RDDS). Moreover the closing time is also the adjustable parameter. The designed model is verified by RDDS testing process in computer simulation. Then the result is compared with the RDDS testing of the real circuit breaker. The testing indicates that the pre-arcing voltage of the real and simulated circuit breakers give the consistent result.
  • Keywords
    SF6 insulation; capacitor switching; circuit breakers; EMTP simulation program; SF6; adaptive algorithm; capacitor bank controlled switching simulation; computer simulation; high voltage SF6 circuit breaker modeling; prearcing voltage; rate of decrease of dielectric strength; Adaptive algorithm; Circuit breakers; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Sulfur hexafluoride; Switched capacitor circuits; Switching circuits; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering/Electronics Computer Telecommunications and Information Technology (ECTI-CON), 2010 International Conference on
  • Conference_Location
    Chaing Mai
  • Print_ISBN
    978-1-4244-5606-2
  • Electronic_ISBN
    978-1-4244-5607-9
  • Type

    conf

  • Filename
    5491448