DocumentCode
519634
Title
Selecting error patters based on symbol reliability for OSD algorithm
Author
Zi-Jian, Dong ; Guo-Lei, Qiao
Author_Institution
Sch. of Electron. Eng., Huaihai Inst. of Technol., Lianyungang, China
Volume
2
fYear
2010
fDate
21-24 May 2010
Abstract
A new scheme of selecting error pattern is proposed. OSD algorithm processes certain MRIPs of a received sequence, performs bits flip among MRIPs, forms error patterns, and then generates candidate codeword. The bits flip is equal probability among MRIPs in OSD algorithms, which leads to too many candidates generated, and seriously affects the implement of algorithm. This paper proposes an improved algorithm which adopts unequal probability strategy utilizing the reliability of received symbols. The simulation results show that the proposed algorithm is effective. With little performance degradation, the computational complexity of algorithm can be reduced by 60% or more for one class of LDPC codes.
Keywords
computational complexity; decoding; error statistics; parity check codes; probability; statistical analysis; LDPC codes; MRIP; OSD algorithm; bits flip; candidate codeword; computational complexity; equal probability; error patterns; performance degradation; probability strategy; received sequence; symbol reliability; Block codes; Computational complexity; Computational modeling; Degradation; Error analysis; Maximum likelihood decoding; Parity check codes; Probability; Reliability engineering; Statistics; error pattern; most reliable independent positions (MRIPs); ordered statistic decoding (OSD);
fLanguage
English
Publisher
ieee
Conference_Titel
Future Computer and Communication (ICFCC), 2010 2nd International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-5821-9
Type
conf
DOI
10.1109/ICFCC.2010.5497428
Filename
5497428
Link To Document