Integrated active sensors for chip-level near-field scanning

Author

Uddin, Nasir ; Thiede, Andreas

Author_Institution

High-Freq. Electron., Univ. of Paderborn, Paderborn, Germany

fYear

2010

fDate

15-17 March 2010

Firstpage

28

Lastpage

31

Abstract

Integrated active sensors for near-field scanning of printed circuit boards (PCB) as well as large scale integrated (LSI) circuits are presented in this paper. A miniature square loop and a miniature dipole are designed and monolithically integrated with two wideband differential amplifiers with a gain of about 28 dB and 22 dB respectively and a bandwidth of about 10 GHz. On-wafer measurement results of the integrated active sensors are presented.

Keywords

differential amplifiers; large scale integration; printed circuit design; wideband amplifiers; LSI circuit; chip-level near-field scanning; integrated active sensors; large scale integrated circuit; miniature dipole; miniature square loop; on-wafer measurement; printed circuit board; wideband differential amplifier; Electromagnetic compatibility; Electromagnetic interference; Frequency; Large scale integration; Magnetic field measurement; Magnetic flux; Printed circuits; Probes; Spatial resolution; Voltage; active sensor; electromagentic compatibility; near-field scan; wideband amplifier;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2010 German

Conference_Location

Berlin

Print_ISBN

978-1-4244-4933-0

Electronic_ISBN

978-3-9812668-1-8

Type

conf

Filename

5498247