DocumentCode :
519801
Title :
Integrated active sensors for chip-level near-field scanning
Author :
Uddin, Nasir ; Thiede, Andreas
Author_Institution :
High-Freq. Electron., Univ. of Paderborn, Paderborn, Germany
fYear :
2010
fDate :
15-17 March 2010
Firstpage :
28
Lastpage :
31
Abstract :
Integrated active sensors for near-field scanning of printed circuit boards (PCB) as well as large scale integrated (LSI) circuits are presented in this paper. A miniature square loop and a miniature dipole are designed and monolithically integrated with two wideband differential amplifiers with a gain of about 28 dB and 22 dB respectively and a bandwidth of about 10 GHz. On-wafer measurement results of the integrated active sensors are presented.
Keywords :
differential amplifiers; large scale integration; printed circuit design; wideband amplifiers; LSI circuit; chip-level near-field scanning; integrated active sensors; large scale integrated circuit; miniature dipole; miniature square loop; on-wafer measurement; printed circuit board; wideband differential amplifier; Electromagnetic compatibility; Electromagnetic interference; Frequency; Large scale integration; Magnetic field measurement; Magnetic flux; Printed circuits; Probes; Spatial resolution; Voltage; active sensor; electromagentic compatibility; near-field scan; wideband amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2010 German
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-4933-0
Electronic_ISBN :
978-3-9812668-1-8
Type :
conf
Filename :
5498247
Link To Document :
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