Title :
Methods and schemes of measuring the electric circuit resistance parameter value
Author :
Pukach, Andriy ; Ivantsiv, Roman-Andriy ; Teslyuk, Vasyl
Author_Institution :
CAM Dept., Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
A short analysis of the existing methods and schemes of measuring the unknown value of the electric circuit resistance parameter is conducted in present article. Their principle advantages and disadvantages are specified from the point of view of their prospective improvement aimed at solution of the problem of electric resistance measuring accuracy in MEMS technologies.
Keywords :
electric resistance measurement; micromechanical devices; MEMS technologies; electric circuit resistance parameter value measurement; Bridge circuits; Electric resistance; Electric variables measurement; Electrical resistance measurement; Immune system; Micromechanical devices; Strain measurement; Surface resistance; Voltage measurement; Voltmeters; MEMS; electric resistance; ohmmeter; resistance parameter;
Conference_Titel :
Perspective Technologies and Methods in MEMS Design (MEMSTECH), 2010 Proceedings of VIth International Conference on
Conference_Location :
Lviv
Print_ISBN :
978-1-4244-7325-0
Electronic_ISBN :
978-966-2191-11-0
