• DocumentCode
    519996
  • Title

    Molecular water accumulation on silica measured with picometer height resolution

  • Author

    Wang, Xuefeng ; Zhao, Ming ; Nolte, David D.

  • Author_Institution
    Dept. of Phys., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    16-21 May 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We observed water film accumulation on silica surfaces to 1 picometer resolution using optical land-contrast (LC) interferometry. The land-contrast approach is non-destructive and allows real-time measurement of thickness variation of small molecular films.
  • Keywords
    light interferometry; silicon compounds; thickness measurement; water; wetting; SiO2; molecular film; molecular water accumulation; optical land contrast interferometry; picometer height resolution; thickness variation measurement; water film accumulation; Biomedical optical imaging; Biosensors; Chemicals; Optical films; Optical interferometry; Optical sensors; Optical surface waves; Proteins; Reflectivity; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-890-2
  • Electronic_ISBN
    978-1-55752-890-2
  • Type

    conf

  • Filename
    5499554
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=519996