Title :
Molecular water accumulation on silica measured with picometer height resolution
Author :
Wang, Xuefeng ; Zhao, Ming ; Nolte, David D.
Author_Institution :
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA
Abstract :
We observed water film accumulation on silica surfaces to 1 picometer resolution using optical land-contrast (LC) interferometry. The land-contrast approach is non-destructive and allows real-time measurement of thickness variation of small molecular films.
Keywords :
light interferometry; silicon compounds; thickness measurement; water; wetting; SiO2; molecular film; molecular water accumulation; optical land contrast interferometry; picometer height resolution; thickness variation measurement; water film accumulation; Biomedical optical imaging; Biosensors; Chemicals; Optical films; Optical interferometry; Optical sensors; Optical surface waves; Proteins; Reflectivity; Silicon compounds;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
