Title :
Optical measurement of nanomechanical motion with an imprecision at the standard quantum limit
Author :
Anetsberger, G. ; Arcizet, O. ; Gavartin, E. ; Unterreithmeier, Q.P. ; Weig, E.M. ; Gorodetsky, M.L. ; Kotthaus, J.P. ; Kippenberg, T.J.
Author_Institution :
Max-Planck-Inst. fur Quantenopt., Garching, Germany
Abstract :
Ultra-high Q optical microresonators allow measuring nanomechanical motion with unprecedented sensitivity. For the first time, we reach a measurement imprecision at the standard quantum limit which has been a long sought-after goal for nanomechanical oscillators.
Keywords :
micromechanical resonators; motion measurement; optical resonators; optical variables measurement; nanomechanical motion optical measurement; nanomechanical oscillators; optical microresonators; Measurement standards; Microcavities; Motion measurement; Optical refraction; Optical sensors; Optical surface waves; Optical variables control; Oscillators; Resonance; Silicon compounds;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
