DocumentCode
520152
Title
Direct measurement of electron loss rate in air
Author
Dogariu, Arthur ; Shneider, Mikhail N. ; Miles, Richard B.
Author_Institution
Appl. Phys. Group, Princeton Univ., Princeton, NJ, USA
fYear
2010
fDate
16-21 May 2010
Firstpage
1
Lastpage
2
Abstract
We present direct local measurements of electron attachment and recombination rates in atmospheric air. Using a microwave scattering based resonantly enhanced multi-photon ionization scheme we monitor the electron density dynamics with nanosecond resolution.
Keywords
electron attachment; electron density; atmospheric air; direct measurement; electron attachment; electron density dynamics; electron loss rate; microwave scattering; nanosecond resolution; recombination rates; resonantly enhanced multiphoton ionization scheme; Atmospheric measurements; Electrons; Ionization; Loss measurement; Particle scattering; Plasma measurements; Pressure measurement; Radar scattering; Rayleigh scattering; Spontaneous emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-890-2
Electronic_ISBN
978-1-55752-890-2
Type
conf
Filename
5499715
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