DocumentCode
520195
Title
Measurement of the FSR of a high finesse etalon with 2.5 kHz accuracy using a narrow-linewidth frequency swept laser
Author
Mandridis, D. ; Bagnell, M. ; Ozdur, I. ; Delfyett, P.J.
Author_Institution
Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
fYear
2010
fDate
16-21 May 2010
Firstpage
1
Lastpage
2
Abstract
Measurement of the FSR of an etalon having finesse of 1000 with 7 digits of accuracy or 2.5 kHz. A modified PDH technique is used in conjunction with a frequency swept, narrow-linewidth CW laser.
Keywords
Fabry-Perot interferometers; measurement by laser beam; FSR; Fabry-Perot interferometers; Pound-Drever-Hall technique; free spectral range measurement; frequency 2.5 kHz; high finesse etalon; narrow-linewidth frequency swept laser; Distributed feedback devices; Fabry-Perot; Frequency measurement; Laser feedback; Optical feedback; Optical films; Optical mixing; Optical resonators; Radio frequency; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-890-2
Electronic_ISBN
978-1-55752-890-2
Type
conf
Filename
5499762
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