DocumentCode :
520430
Title :
Reliability and performance of pseudomorphic ultraviolet light emitting diodes on bulk aluminum nitride substrates
Author :
Grandusky, James R. ; Cui, Yongjie ; Mendrick, Mark C. ; Gibb, Shawn ; Schowalter, Leo J.
Author_Institution :
Crystal IS, Green Island, NY, USA
fYear :
2010
fDate :
16-21 May 2010
Firstpage :
1
Lastpage :
2
Abstract :
The development of pseudomorphic layers on low dislocation density AlN substrates is leading to improvements in reliability and performance of devices operating in the UVC range.
Keywords :
aluminium compounds; light emitting diodes; AlN; bulk substrates; pseudomorphic layers development; pseudomorphic ultraviolet light emitting diodes; Aluminum nitride; Chemicals; DNA; Electromagnetic wave absorption; Heat sinks; Light emitting diodes; Light sources; Optical devices; Quantum well devices; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
Type :
conf
Filename :
5500008
Link To Document :
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