DocumentCode
520430
Title
Reliability and performance of pseudomorphic ultraviolet light emitting diodes on bulk aluminum nitride substrates
Author
Grandusky, James R. ; Cui, Yongjie ; Mendrick, Mark C. ; Gibb, Shawn ; Schowalter, Leo J.
Author_Institution
Crystal IS, Green Island, NY, USA
fYear
2010
fDate
16-21 May 2010
Firstpage
1
Lastpage
2
Abstract
The development of pseudomorphic layers on low dislocation density AlN substrates is leading to improvements in reliability and performance of devices operating in the UVC range.
Keywords
aluminium compounds; light emitting diodes; AlN; bulk substrates; pseudomorphic layers development; pseudomorphic ultraviolet light emitting diodes; Aluminum nitride; Chemicals; DNA; Electromagnetic wave absorption; Heat sinks; Light emitting diodes; Light sources; Optical devices; Quantum well devices; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-890-2
Electronic_ISBN
978-1-55752-890-2
Type
conf
Filename
5500008
Link To Document