DocumentCode
520456
Title
Angle-resolved thz time domain reflection spectroscopy of rough surfaces
Author
Robiné, Christoph ; Wiegand, Christian ; Rühle, Karola ; Ellrich, Frank ; Weinland, Tristan ; Beigang, René
Author_Institution
Fraunhofer Inst. for Phys. Meas. Tech. IPM, Kaiserslautern, Germany
fYear
2010
fDate
16-21 May 2010
Firstpage
1
Lastpage
2
Abstract
The use of a fiber-coupled terahertz TDS system offers new possibilities for angle-resolved reflection spectroscopy. We put the focus especially on angle-resolved scattering from roughened surfaces of both dielectric and metallic surfaces.
Keywords
optical fibre couplers; rough surfaces; surface scattering; terahertz spectroscopy; angle-resolved reflection spectroscopy; angle-resolved scattering; dielectric surfaces; fiber-coupled terahertz time domain reflection spectroscopy; metallic surfaces; rough surfaces; Bandwidth; Electromagnetic scattering; Optical reflection; Optical scattering; Radar scattering; Reflectivity; Rough surfaces; Spectroscopy; Surface fitting; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-890-2
Electronic_ISBN
978-1-55752-890-2
Type
conf
Filename
5500036
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