DocumentCode :
520637
Title :
Intrinsic laser-induced damage in bulk transparent dielectrics
Author :
Efimov, O.M.
Author_Institution :
HRL Labs., LLC, Malibu, CA, USA
fYear :
2010
fDate :
16-21 May 2010
Firstpage :
1
Lastpage :
2
Abstract :
Our results from experiments on laser-induced damage in transparent dielectrics are incompatible with the well-known avalanche ionization model. The mechanism of damage may involve a collective response of the dielectric, such as “dielectric-metal” phase transition.
Keywords :
Absorption; Dielectric materials; Dielectric measurements; Glass; Ionization; Laser modes; Laser transitions; Optical pulses; Pulse measurements; Solid lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
Type :
conf
Filename :
5500225
Link To Document :
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