Title :
Ultrastable atomic force microscopy using laser-based, active noise cancelation
Author :
Perkins, Thomas T. ; King, Gavin M. ; Churnside, Allison B. ; Carter, Ashley R.
Abstract :
We achieved a 100-fold improvement in tip-sample stability by stabilizing the tip and the sample in 3D using laser light back-scattered off the apex of an AFM tip and a reference mark in the sample.
Keywords :
Active noise reduction; Atom lasers; Atom optics; Atomic beams; Atomic force microscopy; Atomic measurements; Laser noise; Laser stability; Noise cancellation; Optical microscopy;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
