• DocumentCode
    520782
  • Title

    Domain inversion with 0.8µm period by Using a conductive AFM tip and its application to QPM-SHG devices

  • Author

    Minakata, Makoto ; Awano, Haruyuki ; Ohtsuka, Motohiro ; Iwata, Futoshi ; Taniuchi, Tetsuo

  • Author_Institution
    Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
  • fYear
    2010
  • fDate
    16-21 May 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, we demonstrate a newly developed domain inversion technique using the improved AFM which is possible to scan a wide area through a conductive AFM tip, and also a thin LiNbO3 substrate called “a terrace substrate” using a dicing saw. Fine domain inversion period with less than 0.8μm is obtained. A novel SHG blue laser is also demonstrated using the terrace substrate and the extended AFM domain inversion technique.
  • Keywords
    atomic force microscopy; optical fabrication; optical harmonic generation; QPM-SHG Devices; conductive AFM tip; domain inversion; terrace substrate; Absorption; Blades; Glass; Laser beam cutting; Length measurement; Optical devices; Optical harmonic generation; Optical materials; Proposals; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-890-2
  • Electronic_ISBN
    978-1-55752-890-2
  • Type

    conf

  • Filename
    5500380
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=520782