Title :
Analytical technique for determining the size of subwavelength focal spots in far field
Author :
Thongrattanasiri, Sukosin ; Hoffman, Anthony J. ; Escarra, Matthew ; Gmachl, Claire F. ; Podolskiy, Viktor A.
Author_Institution :
Dept. of Phys., Oregon State Univ., Corvallis, OR, USA
Abstract :
We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.
Keywords :
Diffraction gratings; Electromagnetic diffraction; Electromagnetic scattering; Focusing; Image converters; Image reconstruction; Metamaterials; Optical computing; Optical microscopy; Physics;
Conference_Titel :
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-55752-890-2
Electronic_ISBN :
978-1-55752-890-2
