• DocumentCode
    521192
  • Title

    Analytical technique for determining the size of subwavelength focal spots in far field

  • Author

    Thongrattanasiri, Sukosin ; Hoffman, Anthony J. ; Escarra, Matthew ; Gmachl, Claire F. ; Podolskiy, Viktor A.

  • Author_Institution
    Dept. of Phys., Oregon State Univ., Corvallis, OR, USA
  • fYear
    2010
  • fDate
    16-21 May 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.
  • Keywords
    Diffraction gratings; Electromagnetic diffraction; Electromagnetic scattering; Focusing; Image converters; Image reconstruction; Metamaterials; Optical computing; Optical microscopy; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    978-1-55752-890-2
  • Electronic_ISBN
    978-1-55752-890-2
  • Type

    conf

  • Filename
    5500803
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=521192