DocumentCode
521647
Title
Photoluminescence Study of the Interface of Nanocrystalline ZnO/Amorphous ZnO
Author
Wang, Zhijun ; Li, Shouchun ; Mucui Ni ; Li Liu ; Zhang, Jinbao ; Wang, Lianyuan ; Tian, Yunxian ; Wang, Zeheng ; Wei, Aiguo
Author_Institution
Nat. Lab. of Superhard Mater., Jilin Univ., Changchun, China
fYear
2010
fDate
19-21 June 2010
Firstpage
1
Lastpage
3
Abstract
We studied the growth process of nanocrystalline ZnO which grown in amorphous ZnO by photoluminescence (PL). In this process, we found a new visible emission band, the visible emission intensity increased quickly at first, then decreased exponentially, while the peaks energy has a red shift from 583nm to 615nm along with the increasing reaction temperature. The results indicate this visible emission band correlate with the nanocrystalline ZnO/amorphous ZnO interface. The interface was polarized by the activated amorphous ZnO acts with the nanocrystalline ZnO surface, thus charge carrier was self-trapped on the nanocrystalline ZnO surface and emitted visible PL by recombination. We studied the changes rule of the nanocrystalline ZnO / amorphous ZnO interface by the characteristic of visible emission.
Keywords
II-VI semiconductors; amorphous semiconductors; interface phenomena; nanofabrication; nanostructured materials; photoluminescence; red shift; semiconductor growth; wide band gap semiconductors; zinc compounds; ZnO-ZnO; amorphous semiconductor; nanocrystalline materials; photoluminescence; red shift; self-trapped charge carrier; visible emission band; visible emission intensity; Amorphous materials; Diffraction; Laboratories; Nanostructured materials; Periodic structures; Photoluminescence; Semiconductor materials; Temperature; X-ray scattering; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4963-7
Electronic_ISBN
978-1-4244-4964-4
Type
conf
DOI
10.1109/SOPO.2010.5504262
Filename
5504262
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