DocumentCode :
521656
Title :
Using Embedded-Atom Method (EAM) to Simulate Interaction of Intense Laser with Lead in LIBS
Author :
Lu, Yinfei ; Fu, Rao ; Zhang, Guizhong ; Xu, Degang ; Yao, Jianquan
Author_Institution :
Coll. of Precision Instrum. & Optoelectron. Eng., Tianjin Univ., Tianjin, China
fYear :
2010
fDate :
19-21 June 2010
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, we represented our numerical results on LIBS (laser-induced breakdown spectroscopy) process in Lead, excited by intense laser pulses. We used the EAM scheme and the proposed potential form for Lead in molecule dynamics simulation of the ablated process without taking into account the complex solid-liquid-gas phase transition process, which can greatly simplify phase variation of Lead and provide good insight into energies of dislodged ions and crater formation. In our work, we mainly focused on the crater morphology during the laser ablation process, and made comparison of erosion processes for different pulse durations. For the plasma emission, we used statistical method to study the energy distribution of the jetted Lead ions and analyzed the its relevance with the spectral line intensity of Lead, which contributed to the characteristic 406-nm peak of Lead.
Keywords :
laser ablation; lead; molecular dynamics method; plasma production by laser; spectral line intensity; Pb; crater morphology; embedded-atom method; erosion; jetted Lead ions; laser ablation; laser-induced breakdown spectroscopy; molecule dynamics simulation; plasma emission; spectral line intensity; statistical method; wavelength 406 nm; Electric breakdown; Laser ablation; Laser excitation; Laser transitions; Morphology; Optical pulses; Plasma properties; Solid modeling; Spectroscopy; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4963-7
Electronic_ISBN :
978-1-4244-4964-4
Type :
conf
DOI :
10.1109/SOPO.2010.5504283
Filename :
5504283
Link To Document :
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