• DocumentCode
    521695
  • Title

    Research on Measurement of Spectral Radiance for (230-1700)nm Transient Radiation Source

  • Author

    Li, Hongguang ; Wu, Baoning ; Yang, Hongru ; Yu, Bing ; Yin, Qingyan ; Cao, Feng ; Wu, Lei ; Yuan, Liang

  • Author_Institution
    Opt. Metrol. Lab., Xi´´an Inst. of Appl. Opt., Xi´´an, China
  • fYear
    2010
  • fDate
    19-21 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A spectral radiance measurement device is presented for (230-1700) nm transient radiation source. This device consists of a high temperature black body, two off-axis parabolic mirror, a reference radiation, a grating spectrograph and array CCD detector system. The measure principle model is described. In order to improve the measure precision for UV and NIR nanosecond transient radiation, we adjust the CCD integral periods and adopt the fixed phase high speed signal collection method to enhance the SNR of the device. Simultaneously the spectral distortion of the spectrograph is eliminated using non-parametric kernel regression de-noising algorithm and convolution algorithm. Some experiment results are also presented and discussed in this paper.
  • Keywords
    CCD image sensors; brightness; convolution; diffraction gratings; mirrors; optical variables measurement; spectrometers; CCD integral periods; NIR nanosecond transient radiation; UV nanosecond transient radiation; array CCD detector system; convolution algorithm; fixed phase high speed signal collection method; grating spectrograph; non-parametric kernel regression de-noising algorithm; off-axis parabolic mirror; spectral distortion; spectral radiance measurement device; transient radiation source; wavelength 230 nm to 1700 nm; Charge coupled devices; Distortion measurement; Gratings; Mirrors; Nanoscale devices; Phase measurement; Radiation detectors; Sensor arrays; Temperature; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronic (SOPO), 2010 Symposium on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4963-7
  • Electronic_ISBN
    978-1-4244-4964-4
  • Type

    conf

  • DOI
    10.1109/SOPO.2010.5504383
  • Filename
    5504383