• DocumentCode
    521735
  • Title

    More Effective Supervised Learning in Randomized Trees for Feature Recognition

  • Author

    Guo, Junwei ; Chen, Jing ; Wang, Yongtian ; Liu, Wei

  • Author_Institution
    Sch. of Optoelectron., Beijing Inst. of Technol., Beijing, China
  • fYear
    2010
  • fDate
    19-21 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a feature recognition method based on randomized trees. We aim to improve the performance of Lepetit´s work, whose actual results are very sensitive to large changes of viewpoint due to its limited ability of samples synthesizing and learning. We propose an approach to alleviate its limitation, which simulates the image appearance changes under actual viewpoint changes by applying general projective transformations to the standard image rather than affine ones. Affine transformations are usually used in many state-of-the-arts but they cannot adequately represent the actual relationship between two images with different viewpoints. The result is a more effective way of supervised image sample learning in randomized trees for feature recognition that is robust to large changes of viewpoints.
  • Keywords
    affine transforms; feature extraction; image sampling; learning (artificial intelligence); trees (mathematics); Lepetits work; affine transformation; feature recognition method; image appearance changes; randomized tree; supervised image sample learning; Classification tree analysis; Computer vision; Detectors; Image recognition; Object detection; Paper technology; Robustness; Supervised learning; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronic (SOPO), 2010 Symposium on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4963-7
  • Electronic_ISBN
    978-1-4244-4964-4
  • Type

    conf

  • DOI
    10.1109/SOPO.2010.5504467
  • Filename
    5504467