• DocumentCode
    52251
  • Title

    Suppression of Parasitic Substrate Modes in Multilayer Integrated Circuits

  • Author

    Eriksson, Klas ; Gunnarsson, Sten E. ; Nilsson, Per-Ake ; Zirath, Herbert

  • Author_Institution
    Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    57
  • Issue
    3
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    591
  • Lastpage
    594
  • Abstract
    Integrated circuits (ICs) with multilayer backend process and a large front-side ground plane support the propagation of parasitic substrate modes. These modes resonate at frequencies that typically are within the bandwidth of circuits operating close to and in the submillimeter-wave range, i.e, beyond 300 GHz. The resonances cause unwanted coupling and feedback, which result in circuit instability and degraded performance for circuits operating in the range of these resonances. A common method to suppress these modes from propagating is to use numerous through-wafer vias distributed over the entire circuit. In this letter, we present a study of substrate modes in multilayer ICs with thin-film microstrip interconnects at 125-330 GHz. We show that a doped Si carrier underneath the circuit effectively eliminates the effect of substrate modes on the circuit functionality. This method requires no backside processed through-wafer vias and no backside metallization.
  • Keywords
    coplanar waveguides; electromagnetic interference; integrated circuit interconnections; integrated circuit metallisation; microstrip lines; millimetre wave circuits; frequency 125 GHz to 330 GHz; front-side ground plane; multilayer backend process; multilayer integrated circuits; parasitic substrate modes; thin-film microstrip interconnects; Indium phosphide; Loss measurement; Metals; Nonhomogeneous media; Semiconductor device measurement; Silicon; Substrates; Electromagnetic interference; integrated circuit (IC); millimeter wave; parasitic modes; thin-film microstrip lines;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2015.2393359
  • Filename
    7031414