DocumentCode
52251
Title
Suppression of Parasitic Substrate Modes in Multilayer Integrated Circuits
Author
Eriksson, Klas ; Gunnarsson, Sten E. ; Nilsson, Per-Ake ; Zirath, Herbert
Author_Institution
Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Goteborg, Sweden
Volume
57
Issue
3
fYear
2015
fDate
Jun-15
Firstpage
591
Lastpage
594
Abstract
Integrated circuits (ICs) with multilayer backend process and a large front-side ground plane support the propagation of parasitic substrate modes. These modes resonate at frequencies that typically are within the bandwidth of circuits operating close to and in the submillimeter-wave range, i.e, beyond 300 GHz. The resonances cause unwanted coupling and feedback, which result in circuit instability and degraded performance for circuits operating in the range of these resonances. A common method to suppress these modes from propagating is to use numerous through-wafer vias distributed over the entire circuit. In this letter, we present a study of substrate modes in multilayer ICs with thin-film microstrip interconnects at 125-330 GHz. We show that a doped Si carrier underneath the circuit effectively eliminates the effect of substrate modes on the circuit functionality. This method requires no backside processed through-wafer vias and no backside metallization.
Keywords
coplanar waveguides; electromagnetic interference; integrated circuit interconnections; integrated circuit metallisation; microstrip lines; millimetre wave circuits; frequency 125 GHz to 330 GHz; front-side ground plane; multilayer backend process; multilayer integrated circuits; parasitic substrate modes; thin-film microstrip interconnects; Indium phosphide; Loss measurement; Metals; Nonhomogeneous media; Semiconductor device measurement; Silicon; Substrates; Electromagnetic interference; integrated circuit (IC); millimeter wave; parasitic modes; thin-film microstrip lines;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2015.2393359
Filename
7031414
Link To Document