DocumentCode
52297
Title
High-Performance Flexible
ReRAM Device for Low-Power Nonvolatile Memory Applications
Author
Mondal, Sudipta ; Ching-Hao Chueh ; Tung-Ming Pan
Author_Institution
Dept. of Electron. Eng., Chang Gung Univ., Taoyuan, Taiwan
Volume
34
Issue
9
fYear
2013
fDate
Sept. 2013
Firstpage
1145
Lastpage
1147
Abstract
A high-performance very low-power flexible Ni/Sm2O3/indium tin oxide (ITO) resistive device for nonvolatile memories is demonstrated. The device exhibits a good memory margin of >103 ON/OFF current ratio with very low switching power of <;25 μW. Good memory retention of >105 at 85°C and switching endurance of 104 program-read-erase-read cycles is achieved in the highly flexible Ni/Sm2O3/ITO device. The low-power switching operation is believed to be because of the low-energy electron hopping conduction via oxide defects.
Keywords
indium compounds; low-power electronics; nickel; random-access storage; samarium compounds; ITO; Ni-Sm2O3-ITO; high-performance flexible ReRAM device; low-energy electron hopping conduction; low-power nonvolatile memory; low-power switching operation; on-off current ratio; oxide defect; program-read-erase-read cycle; resistive device; temperature 85 C; Electrodes; Electron devices; Indium tin oxide; Nickel; Nonvolatile memory; Resistance; Switches; ${rm Sm}_{2}{rm O}_{3}$ ; Flexible memory; indium tin oxide (ITO); resistive random access memory (ReRAM);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2013.2272455
Filename
6565393
Link To Document