• DocumentCode
    52297
  • Title

    High-Performance Flexible {\\rm Ni}/{\\rm Sm}_{2}{\\rm O}_{3}/{\\rm ITO} ReRAM Device for Low-Power Nonvolatile Memory Applications

  • Author

    Mondal, Sudipta ; Ching-Hao Chueh ; Tung-Ming Pan

  • Author_Institution
    Dept. of Electron. Eng., Chang Gung Univ., Taoyuan, Taiwan
  • Volume
    34
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    1145
  • Lastpage
    1147
  • Abstract
    A high-performance very low-power flexible Ni/Sm2O3/indium tin oxide (ITO) resistive device for nonvolatile memories is demonstrated. The device exhibits a good memory margin of >103 ON/OFF current ratio with very low switching power of <;25 μW. Good memory retention of >105 at 85°C and switching endurance of 104 program-read-erase-read cycles is achieved in the highly flexible Ni/Sm2O3/ITO device. The low-power switching operation is believed to be because of the low-energy electron hopping conduction via oxide defects.
  • Keywords
    indium compounds; low-power electronics; nickel; random-access storage; samarium compounds; ITO; Ni-Sm2O3-ITO; high-performance flexible ReRAM device; low-energy electron hopping conduction; low-power nonvolatile memory; low-power switching operation; on-off current ratio; oxide defect; program-read-erase-read cycle; resistive device; temperature 85 C; Electrodes; Electron devices; Indium tin oxide; Nickel; Nonvolatile memory; Resistance; Switches; ${rm Sm}_{2}{rm O}_{3}$; Flexible memory; indium tin oxide (ITO); resistive random access memory (ReRAM);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2272455
  • Filename
    6565393