• DocumentCode
    523029
  • Title

    Low-power process-variation tolerant arithmetic units using input-based elastic clocking

  • Author

    Mohapatra, Debabrata ; Karakonstantis, Georgios ; Roy, Kaushik

  • Author_Institution
    ECE Sch., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2007
  • fDate
    27-29 Aug. 2007
  • Firstpage
    74
  • Lastpage
    79
  • Abstract
    In this paper we propose a design methodology for low-power, high-performance, process-variation tolerant architecture for arithmetic units. The novelty of our approach lies in the fact that possible delay failures due to process variations and/or voltage scaling are predicted in advance and addressed by employing an elastic clocking technique. The prediction mechanism exploits the dependence of delay of arithmetic units upon input data patterns and identifies specific inputs that activate the critical path. Under iso-yield conditions, the proposed design operates at a lower scaled down Vdd without any performance degradation, while it ensures a superlative yield under a design style employing nominal supply and transistor threshold voltage. Simulation results show power savings of upto 29%, energy per computation savings of upto 25.5% and yield enhancement of upto 11.1% compared to the conventional adders and multipliers implemented in the 70nm BPTM technology. We incorporated the proposed modules in the execution unit of a five stage DLX pipeline to measure performance using SPEC2000 benchmarks [9]. Maximum area and throughput penalty obtained were 10% and 3% respectively.
  • Keywords
    digital arithmetic; logic design; low-power electronics; BPTM technology; DLX pipeline; data pattern; delay failure; design methodology; elastic clocking; iso-yield condition; low-power process-variation tolerant arithmetic units; power savings; supply voltage; transistor threshold voltage; voltage scaling; Adders; Arithmetic; Clocks; Delay; Frequency; Logic design; Process design; Robustness; Throughput; Voltage; elastic clocking; low power; process tolerant;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design (ISLPED), 2007 ACM/IEEE International Symposium on
  • Conference_Location
    Portland, OR
  • Electronic_ISBN
    978-1-59593-709-4
  • Type

    conf

  • DOI
    10.1145/1283780.1283797
  • Filename
    5514254