• DocumentCode
    523040
  • Title

    Towards a software approach to mitigate voltage emergencies

  • Author

    Gupta, Meeta S. ; Rangan, K.K. ; Smith, M.D. ; Gu-Yeon Wei ; Brooks, David

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
  • fYear
    2007
  • fDate
    27-29 Aug. 2007
  • Firstpage
    123
  • Lastpage
    128
  • Abstract
    Increases in peak current draw and reductions in the operating voltages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. One approach suggested has been to not only react to these fluctuations but also attempt to eliminate future occurrences of these fluctuations by dynamically modifying the executing program. This paper investigates the potential of a very simple dynamic scheme to appreciably reduce the number of run-time voltage emergencies. It shows that we can map many of the voltage emergencies in the execution of the SPEC benchmarks on an aggressive superscalar design to a few static loops, categorize the microarchitectural cause of the emergencies in each important loop through simple observations and a simple priority function, and finally apply straight forward software optimization strategies to mitigate up to 70% of the future voltage swings.
  • Keywords
    electric potential; microprocessor chips; optimisation; power aware computing; software engineering; operating voltage; processors; software optimization; superscalar design; voltage emergency; voltage fluctuation; Circuits; Computer interfaces; Costs; Design optimization; Hardware; Microarchitecture; Permission; Power system reliability; Runtime; Voltage fluctuations; di/dt; dynamic optimization framework; hardware-software codesign; voltage emergencies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design (ISLPED), 2007 ACM/IEEE International Symposium on
  • Conference_Location
    Portland, OR
  • Electronic_ISBN
    978-1-59593-709-4
  • Type

    conf

  • DOI
    10.1145/1283780.1283808
  • Filename
    5514265