• DocumentCode
    523579
  • Title

    SCEMIT: A SystemC error and mutation injection tool

  • Author

    Lisherness, P. ; Kwang-Ting Cheng

  • Author_Institution
    Univ. of California, Santa Barbara, CA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    228
  • Lastpage
    233
  • Abstract
    As high-level models in C and SystemC are increasingly used for verification and even design (through high-level synthesis) of electronic systems, there is a growing need for compatible error injection tools to facilitate further development of coverage metrics and automated diagnosis. This paper introduces SCEMIT, a tool for the automated injection of errors into C/C++/SystemC models. A selection of `mutation´ style errors are supported, and injection is performed though a plugin interface in the GCC compiler, which minimizes the impact of SCEMIT on existing simulation flows. Experimental injected error detection results are presented for the set of OSCI SystemC Example Models as well as the CHStone C High-Level-Synthesis benchmark set. Aside from demonstrating compatibility with these models, the results show the value of high-level error injection as a coverage measure compared to conventional code coverage measures.
  • Keywords
    C++ language; program compilers; program diagnostics; program verification; software metrics; C models; C++ models; CHStone C high-level-synthesis benchmark set; GCC compiler; OSCI SystemC example models; SCEMIT; SystemC error; automated diagnosis; coverage metrics; electronic systems; error injection tools; injected error detection; mutation injection tool; plugin interface; Debugging; Genetic mutations; Hardware; High level synthesis; Integrated circuit measurements; Integrated circuit synthesis; Partitioning algorithms; Permission; Research and development; Software algorithms; SystemC; coverage; high-level synthesis; mutation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5522627