Title :
EDA challenges and options: Investing for the future
Author :
Puri, R. ; Joyner, W. ; Jammy, R. ; Jerraya, A. ; Rabaey, J. ; Rhines, W.C. ; Stok, L.
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
Abstract :
As the overall economy and semiconductor industry emerges from one of the worst recessions in years, it is time to take stock of EDA challenges and its future. This panel will focus on which challenges will surge and dominate EDA over the course of next several years and which challenges we can sell short.
Keywords :
electronic design automation; integrated circuit design; semiconductor industry; EDA industry; IC design; electronic design automation; semiconductor industry; CMOS technology; Costs; Design automation; Electronic design automation and methodology; Electronics industry; Energy management; Power system management; Productivity; Signal design; USA Councils; Design Challenges; Electronic Design Automation;
Conference_Titel :
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6677-1
