• DocumentCode
    523724
  • Title

    Analyze Overlapping Baker Square Wave Voltammograms Based on Data Mining

  • Author

    Gao, Ling ; Ren, Shouxin

  • Author_Institution
    Dept. of Chem., Inner Mongolia Univ., Huhhot, China
  • Volume
    1
  • fYear
    2010
  • fDate
    11-12 May 2010
  • Firstpage
    715
  • Lastpage
    718
  • Abstract
    A novel method, referred to as OSC-WPT-PLS approach based on partial least squares(PLS) regression with orthogonal signal correction(OSC) and wavelet packet transform (WPT) as preprocessed tools, was proposed to carry out the simultaneous voltammetric determination of Pb(II), Tl(I) and In (III) for the first time. This method combines the ideas of OSC and WPT with PLS regression for enhancing the ability of extracting characteristic information and the quality of regression. The relative standard errors of prediction (RSEP) obtained for all elements using OSC-WPT-PLS, WPT-PLS and PLS were compared. Experimental results demonstrated that the OSC-WPT-PLS method had the best performance among the three methods and was successful even when there was severe overlap of voltammgrams.
  • Keywords
    chemical engineering computing; data mining; error correction; least mean squares methods; regression analysis; signal processing; voltammetry (chemical analysis); wavelet transforms; OSC; PLS; RSEP; WPT; data mining; orthogonal signal correction; overlapping Baker square wave voltammograms; partial least square regression; relative standard errors of prediction; voltammetric determination; wavelet packet transform; Calibration; Chemical technology; Chemistry; Data analysis; Data mining; Least squares methods; Redundancy; Signal processing; Wavelet packets; Wavelet transforms; data mining; multivariate calibration; orthogonal signal correction; overlapping voltammogram; signal processing; wavelet packet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Computation Technology and Automation (ICICTA), 2010 International Conference on
  • Conference_Location
    Changsha
  • Print_ISBN
    978-1-4244-7279-6
  • Electronic_ISBN
    978-1-4244-7280-2
  • Type

    conf

  • DOI
    10.1109/ICICTA.2010.156
  • Filename
    5522962