DocumentCode
523782
Title
Fully X-tolerant, very high scan compression
Author
Wohl, Peter ; Waicukauski, John A. ; Neuveux, Frederic ; Gizdarski, Emil
Author_Institution
Synopsys, Inc., Mountain View, CA, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
362
Lastpage
367
Abstract
This paper presents a new X-blocking system which allows very high compression and full coverage even if the density of unknown values is very high and varies every shift. Despite the presence of Xs in scan cells, compression can be maximized by using PRPG and MISR structures. Results on industrial designs with various X densities demonstrate consistently high compression and full test coverage.
Keywords
Algorithm design and analysis; Automatic test pattern generation; Bandwidth; Circuit faults; Circuit testing; Computer architecture; Costs; Integrated circuit reliability; Phase shifters; Predictive models; Compression; LFSR; MISR; VLSI Test; X-tolerant;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location
Anaheim, CA, USA
ISSN
0738-100X
Print_ISBN
978-1-4244-6677-1
Type
conf
Filename
5523080
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