Title :
Model-based functional verification
Author :
Kundert, Ken ; Chang, Henry
Abstract :
Just as digital design did 15 years ago; analog design has now readied a transition. The move to CMOS has made analog circuits more functionally complex, and that complexity leads naturally to functional errors in the designs, which in turn leads to respins and delays. And just as digital designers did 15 years ago, analog designers are beginning to realize that they need to employ a rigorous functional verification methodology. We present the basic concepts of analog verification that can be used to find a wide variety of functional errors in complex mixed-signal integrated circuits.
Keywords :
CMOS integrated circuits; mixed analogue-digital integrated circuits; CMOS; analog verification; complex mixed-signal integrated circuits; model-based functional verification; Analog integrated circuits; Circuit testing; Communication system control; Digital control; Error correction; Logic; Radio frequency; Regulators; Semiconductor device modeling; Software testing;
Conference_Titel :
Design Automation Conference (DAC), 2010 47th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6677-1