• DocumentCode
    523901
  • Title

    Pulsed-latch aware placement for timing-integrity optimization

  • Author

    Chuang, Yi-Lin ; Kim, Sangmin ; Shin, Youngsoo ; Chang, Yao-Wen

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    280
  • Lastpage
    285
  • Abstract
    Utilizing pulsed latches in a circuit is one emerging solution to timing improvements. Pulsed latches, driven by a brief clock signal generated from pulse generators, possess superior design parameters over flip-flops. If pulse generators and pulsed latches are not placed properly, however, pulse-width degradations at pulsed latches and thus timing violations might occur. In this paper, we introduce the pulsed-latch aware placement problem for timing integrity and present a unified placement framework to tackle this problem. Our new placer has the following distinguished features: (1) a multilevel pulsed-latch aware analytical placement framework to effectively prevent the potential pulse-width distortion problem, (2) a physical-information aware latch grouping algorithm to identify each desired group of a pulse generator and pulsed latches, and (3) a new optimization gradient for global placement to consider the impact of load capacitance of generators. Experimental results show that our placement flow can effectively consider pulse-width integrity and thus achieve much smaller total/worst negative slacks with marginal wirelength overheads, compared to a leading commercial and an academic placement flows.
  • Keywords
    flip-flops; integrated logic circuits; logic design; signal generators; flip-flops; global placement; load capacitance; pulse generators; pulsed latches; pulsed-latch aware placement; timing-integrity optimization; Clocks; Degradation; Flip-flops; Latches; Pulse circuits; Pulse generation; Signal design; Signal generators; Space vector pulse width modulation; Timing; Physical Design; Placement; Pulsed latch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5523357