• DocumentCode
    523984
  • Title

    Eyecharts: Constructive benchmarking of gate sizing heuristics

  • Author

    Gupta, Puneet ; Kahng, Andrew B. ; Kasibhatla, Amarnath ; Sharma, Puneet

  • Author_Institution
    Univ. of California, Los Angeles, CA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    597
  • Lastpage
    602
  • Abstract
    Discrete gate sizing is one of the most commonly used, flexible, and powerful techniques for digital circuit optimization. The underlying problem has been proven to be NP-hard. Several (suboptimal) gate sizing heuristics have been proposed over the past two decades, but research has suffered from the lack of any systematic way of assessing the quality of the proposed algorithms. We develop a method to generate benchmark circuits (called eyecharts) of arbitrary size along with a method to compute their optimal solutions using dynamic programming. We evaluate the suboptimalities of some popular gate sizing algorithms. Eyecharts help diagnose the weaknesses of existing gate sizing algorithms, enable systematic and quantitative comparison of sizing algorithms, and catalyze further gate sizing research. Our results show that common sizing methods (including commercial tools) can be suboptimal by as much as 54% (Vt-assignment), 46% (gate sizing) and 49% (gate-length biasing) for realistic libraries and circuit topologies.
  • Keywords
    circuit complexity; circuit optimisation; NP-hard problem; constructive benchmarking; digital circuit optimization; discrete gate sizing; dynamic programming; eyecharts; suboptimal gate sizing heuristics; Algorithm design and analysis; Benchmark testing; Circuit topology; Delay; Dynamic programming; Logic; Permission; Software libraries; Threshold voltage; Very large scale integration; Gate sizing; benchmarking; dynamic programming;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2010 47th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-4244-6677-1
  • Type

    conf

  • Filename
    5523536