Title :
A physical level study and optimization of CAM-based checkpointed register alias table
Author :
Safi, E. ; Moshovos, Andreas ; Veneris, Andreas
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, Japan
Abstract :
Using full-custom layouts in 130 nm technology, this work studies how the latency and energy of a checkpointed, CAM-based Register Alias Table (cRAT) vary as a function of the window size, the issue width, and the number of embedded global checkpoints (GCs). These results are compared to those of the SRAM-based RAT (sRAT). Understanding these variations is useful during the early stages of architectural exploration where physical level information is not yet available. It is found that compared to sRAT, cRAT is more sensitive to the number of physical registers and issue width, however, it is less sensitive to the number of GCs. In addition, beyond a certain number of GCs, cRAT becomes faster than its equivalent sRAT. For instance, this is true when a RAT for 64 architectural and 128 physical registers has at least 20 GCs. This work also proposes an energy optimization for the cRAT; this optimization selectively disables cRAT entries that do not result in a match during lookup. The energy savings are, for the most part, a function of the number of physical registers. For instance, for a cRAT with 128 entries energy is reduced by 40%.
Keywords :
checkpointing; computer aided manufacturing; computer architecture; energy consumption; optimisation; optimising compilers; table lookup; CAM-based checkpointed register alias table; architectural registers; cRAT; energy optimization; energy savings; full-custom layouts; global checkpoints; lookup; sRAT; window size; Checkpointing; Decoding; Delay; Fabrication; Integrated circuit measurements; Permission; Rats; Registers; Size control; Technological innovation; checkpointing; energy; latency; register renaming;
Conference_Titel :
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8634-2
Electronic_ISBN :
978-1-60558-109-5
DOI :
10.1145/1393921.1393982