DocumentCode
524115
Title
Error-resilient low-power Viterbi decoders
Author
Abdallah, Rami A. ; Shanbhag, Naresh R.
Author_Institution
Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2008
fDate
11-13 Aug. 2008
Firstpage
111
Lastpage
116
Abstract
Two low-power Viterbi decoder (VD) architectures are presented in this paper. In the first, limited decision errors are introduced in the add-compare-select units (ACSUs) of a VD to reduce their critical path delays so that they can be operated at lower supply voltages in absence of timing errors. In the second one, we allow data-dependent timing errors which occur whenever a critical path in the ACSU is excited. Algorithmic noise-tolerance (ANT) is then applied at the level of the ACSU to correct for these errors. Power reduction in this design is achieved by either overscaling the supply voltage (voltage overscaling (VOS)) or designing at the nominal process corner and supply voltage (average-case design). Power savings in the first and second design are 58% and 40% at a coding loss of 0:15 dB and 1:1 dB respectively in a IBM 130 nm CMOS process.
Keywords
CMOS integrated circuits; Viterbi decoding; codecs; CMOS process; add-compare-select units; algorithmic noise-tolerance; coding loss; data-dependent timing errors; error-resilient low-power Viterbi decoders; loss 1.1 dB; loss 15 dB; power savings; voltage overscaling; Algorithm design and analysis; Bit error rate; Decoding; Delay; Energy consumption; Error correction; Power system reliability; Timing; Viterbi algorithm; Voltage; algorithmic noise tolerance; error resilient; low power; process variations; viterbi; voltage overscaling;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
Conference_Location
Bangalore
Print_ISBN
978-1-4244-8634-2
Electronic_ISBN
978-1-60558-109-5
Type
conf
DOI
10.1145/1393921.1393951
Filename
5529056
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