DocumentCode :
524115
Title :
Error-resilient low-power Viterbi decoders
Author :
Abdallah, Rami A. ; Shanbhag, Naresh R.
Author_Institution :
Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2008
fDate :
11-13 Aug. 2008
Firstpage :
111
Lastpage :
116
Abstract :
Two low-power Viterbi decoder (VD) architectures are presented in this paper. In the first, limited decision errors are introduced in the add-compare-select units (ACSUs) of a VD to reduce their critical path delays so that they can be operated at lower supply voltages in absence of timing errors. In the second one, we allow data-dependent timing errors which occur whenever a critical path in the ACSU is excited. Algorithmic noise-tolerance (ANT) is then applied at the level of the ACSU to correct for these errors. Power reduction in this design is achieved by either overscaling the supply voltage (voltage overscaling (VOS)) or designing at the nominal process corner and supply voltage (average-case design). Power savings in the first and second design are 58% and 40% at a coding loss of 0:15 dB and 1:1 dB respectively in a IBM 130 nm CMOS process.
Keywords :
CMOS integrated circuits; Viterbi decoding; codecs; CMOS process; add-compare-select units; algorithmic noise-tolerance; coding loss; data-dependent timing errors; error-resilient low-power Viterbi decoders; loss 1.1 dB; loss 15 dB; power savings; voltage overscaling; Algorithm design and analysis; Bit error rate; Decoding; Delay; Energy consumption; Error correction; Power system reliability; Timing; Viterbi algorithm; Voltage; algorithmic noise tolerance; error resilient; low power; process variations; viterbi; voltage overscaling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8634-2
Electronic_ISBN :
978-1-60558-109-5
Type :
conf
DOI :
10.1145/1393921.1393951
Filename :
5529056
Link To Document :
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