• DocumentCode
    524132
  • Title

    Dynamic virtual ground voltage estimation for power gating

  • Author

    Hao Xu ; Vemuri, Ranga ; Jone, Wen-Ben

  • Author_Institution
    Dept. of ECE, Univ. of Cincinnati, Cincinnati, OH, USA
  • fYear
    2008
  • fDate
    11-13 Aug. 2008
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    With the technology moving into the deep sub-100 nm region, the increase of leakage power consumption necessitates more aggressive power reduction techniques. Power gating is a promising technique. Our research emphasizes the virtual ground voltage (VVG) as the key to make critical design trade-offs for power gating. We develop an accurate model to estimate the dynamic VVG value of a circuit block as a function of time after its ground is gated. Experimental results show that the model has less than 1% average error compared with HSPICE results. The CAD tool implemented based on the model has a 100 times speedup over HSPICE.
  • Keywords
    integrated circuit design; VVG; dynamic virtual ground voltage estimation; leakage power consumption; power gating; power reduction technique; CMOS technology; Circuit noise; Design automation; Dynamic voltage scaling; Energy consumption; Gate leakage; Leakage current; Logic circuits; MOSFET circuits; Power supplies; leakage power consumption; power gating; virtual ground voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design (ISLPED), 2008 ACM/IEEE International Symposium on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-8634-2
  • Electronic_ISBN
    978-1-60558-109-5
  • Type

    conf

  • DOI
    10.1145/1393921.1393934
  • Filename
    5529074