Title :
A post-processing approach to minimize TSV number for high-level synthesis of 3D ICs
Author :
Lee, Chih-Hung ; Huang, Tsorng-Yu ; Cheng, Chun-Hua ; Huang, Shih-Hsu
Author_Institution :
Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
Abstract :
3D IC technology stacks multiple integrated chips and its application is more and more popular. Therefore, developing CAD tools for the requirement of 3D architecture becomes urgent and important. In this paper, we present an integer linear programming (ILP) model for the application of resource layer assignment in high level synthesis. Our objective is to minimize the number of signal through-silicon-vias (TSVs) under both the layer number constraint and the footprint area constraint. Our approach has two possible applications: (1) a post-processing method to perform TSV number minimization for high-level synthesis of 3D ICs; (2) a post-processing method to transfer a design from 2D IC structure into 3D IC structure. Note that our approach guarantees minimizing the number of TSVs. Experimental data show that our approach works well in practice.
Keywords :
circuit CAD; electronic engineering computing; high level synthesis; integer programming; linear programming; minimisation; three-dimensional integrated circuits; 3D IC technology; 3D architecture; CAD; TSV number minimization; footprint area constraint; high level synthesis; integer linear programming; layer number constraint; multiple integrated chip; post processing method; resource layer assignment; through silicon vias technology; Application specific integrated circuits; Automatic control; Design automation; High level synthesis; Integer linear programming; Integrated circuit interconnections; Integrated circuit synthesis; Minimization methods; Three-dimensional integrated circuits; Through-silicon vias; Electronic Design Automation; High-Level Synthesis; Integer Linear Programming; Resource Layer Assignment; Three Dimensional Integration Circuits;
Conference_Titel :
Computer Communication Control and Automation (3CA), 2010 International Symposium on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-5565-2
DOI :
10.1109/3CA.2010.5533773