Title :
Automatic measurement system for junction temperature of light emitting diodes
Author :
Kuo, C.L. ; Lin, D.Y.
Author_Institution :
Dept. of Electron. Eng., Nat. Changhua Univ. of Educ., Changhua, Taiwan
Abstract :
In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200°C.
Keywords :
automatic test software; electronic engineering computing; light emitting diodes; quantum well devices; semiconductor quantum wells; temperature measurement; InGaN-GaN; PC-based automatic measurement system; control software design; current 10 mA to 300 mA; data acquisition; forward currents; heating hardware; light emitting diode junction temperatures; multiquantum well LED; temperature 30 degC to 200 degC; Automatic control; Control systems; Current measurement; Data acquisition; Hardware; Heating; Light emitting diodes; Software design; Temperature control; Temperature measurement; LED; junction temperature; multiquantum well;
Conference_Titel :
Computer Communication Control and Automation (3CA), 2010 International Symposium on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-5565-2
DOI :
10.1109/3CA.2010.5533832
