DocumentCode
52488
Title
Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis
Author
Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu
Author_Institution
Qualcomm Atheros Inc., San Jose, CA, USA
Volume
34
Issue
6
fYear
2015
fDate
Jun-15
Firstpage
1014
Lastpage
1026
Abstract
Reasoning-based functional-fault diagnosis has recently been advocated to achieve high diagnosis accuracy, low defect escapes, and reducing manufacturing cost. However, such diagnosis method requires a rich set of test items (syndromes) and a sizable database of faulty boards to learn from. An insufficient number of failed boards, ambiguous root-cause identification, and redundant or irrelevant syndromes can render reasoning-based diagnosis ineffective. Periodic evaluation and analysis can help locate weaknesses in a diagnosis system and thereby provide guidelines for redesigning the tests, which facilitates better diagnosis. We propose an information-theoretic framework for evaluating the effectiveness of and providing guidance to a reasoning-based functional-fault diagnosis system. Syndrome analysis based on feature selection methods provides a representative set of syndromes and suggests irrelevant syndromes in diagnosis. Root-cause analysis measures the discriminative ability of differentiating a given root cause from others. Results are presented for four types of diagnosis systems for three complex boards that are in volume production.
Keywords
cause-effect analysis; fault diagnosis; feature selection; functional analysis; printed circuit testing; ambiguous root-cause identification; discriminative ability; faulty boards; feature selection methods; information-theoretic framework; irrelevant syndromes; periodic evaluation; reasoning-based functional-fault diagnosis; syndrome analysis; test items; Accuracy; Circuit faults; Databases; Fault diagnosis; Maintenance engineering; Manufacturing; Measurement; Board-level; diagnosis; evaluation; functional failure; information-theory; machine learning;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2015.2399438
Filename
7031434
Link To Document