• DocumentCode
    52488
  • Title

    Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis

  • Author

    Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu

  • Author_Institution
    Qualcomm Atheros Inc., San Jose, CA, USA
  • Volume
    34
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    1014
  • Lastpage
    1026
  • Abstract
    Reasoning-based functional-fault diagnosis has recently been advocated to achieve high diagnosis accuracy, low defect escapes, and reducing manufacturing cost. However, such diagnosis method requires a rich set of test items (syndromes) and a sizable database of faulty boards to learn from. An insufficient number of failed boards, ambiguous root-cause identification, and redundant or irrelevant syndromes can render reasoning-based diagnosis ineffective. Periodic evaluation and analysis can help locate weaknesses in a diagnosis system and thereby provide guidelines for redesigning the tests, which facilitates better diagnosis. We propose an information-theoretic framework for evaluating the effectiveness of and providing guidance to a reasoning-based functional-fault diagnosis system. Syndrome analysis based on feature selection methods provides a representative set of syndromes and suggests irrelevant syndromes in diagnosis. Root-cause analysis measures the discriminative ability of differentiating a given root cause from others. Results are presented for four types of diagnosis systems for three complex boards that are in volume production.
  • Keywords
    cause-effect analysis; fault diagnosis; feature selection; functional analysis; printed circuit testing; ambiguous root-cause identification; discriminative ability; faulty boards; feature selection methods; information-theoretic framework; irrelevant syndromes; periodic evaluation; reasoning-based functional-fault diagnosis; syndrome analysis; test items; Accuracy; Circuit faults; Databases; Fault diagnosis; Maintenance engineering; Manufacturing; Measurement; Board-level; diagnosis; evaluation; functional failure; information-theory; machine learning;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2015.2399438
  • Filename
    7031434