Title :
A new method for refractive index measurement of isotropic and anisotropic materials in millimeter and submillimeter wave range
Author :
Andrushchak, N.A. ; Bobitskii, Ya V. ; Maksymyuk, T.V. ; Syrotynsky, O.I. ; Andrushchak, A.S. ; Karbovnyk, I.D.
Author_Institution :
Dept. of Photonics, Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
Based on patented by us interferometer-turning method the experimental set-up for refractive index measurement of parallel plates from isotropic and anisotropic materials in ranges millimeter-submillimeter (mm-submm) wave length have been created and described. The process of interference fringe shift measurement that based on created software has been analyzed, necessary working correlations have been given and experimental accuracy of refractive indexes measurement has been appraised.
Keywords :
Anisotropic magnetoresistance; Dielectric measurements; Mirrors; Optical resonators; Optical waveguides; Permittivity measurement; Position measurement; Refractive index; Submillimeter wave measurements; Wavelength measurement; interferometric-turning method; isotropic and anisotropic materials; refractive index;
Conference_Titel :
Microwave Radar and Wireless Communications (MIKON), 2010 18th International Conference on
Conference_Location :
Vilnius, Lithuania
Print_ISBN :
978-1-4244-5288-0
