Microwave radar for express testing of semiconductor materials

The microwave radar for express testing of semiconductor materials consisting of pulsed magnet, transmitting and receiving antennas, HF generator, pulsed modulator and digital oscilloscope are described. In semiconductor specimen put in pulsed magnetic field a magnetoplasmic wave is excited and propagated through a specimen signal and reference signal delay is measured to find a value of concentration of free charge carriers in semiconductors. Experimental data of testing of InSb, CdHgTe specimens are presented and an acceptable correspondence of results was achieved.