DocumentCode
525066
Title
Microwave radar for express testing of semiconductor materials
Author
Novickij, Jurij
Author_Institution
Dept. of Electr. Eng., Vilnius Gediminas Tech. Univ., Vilnius, Lithuania
fYear
2010
fDate
14-16 June 2010
Firstpage
1
Lastpage
2
Abstract
The microwave radar for express testing of semiconductor materials consisting of pulsed magnet, transmitting and receiving antennas, HF generator, pulsed modulator and digital oscilloscope are described. In semiconductor specimen put in pulsed magnetic field a magnetoplasmic wave is excited and propagated through a specimen signal and reference signal delay is measured to find a value of concentration of free charge carriers in semiconductors. Experimental data of testing of InSb, CdHgTe specimens are presented and an acceptable correspondence of results was achieved.
Keywords
Magnetic field measurement; Magnetic semiconductors; Materials testing; Microwave antennas; Pulse measurements; Pulse modulation; Radar antennas; Receiving antennas; Semiconductor device testing; Semiconductor materials; magnetoplasma; microwave radar; pulsed magnet; semiconductor;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Radar and Wireless Communications (MIKON), 2010 18th International Conference on
Conference_Location
Vilnius, Lithuania
Print_ISBN
978-1-4244-5288-0
Type
conf
Filename
5540469
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