DocumentCode
525627
Title
Dual-subspaces based quantitative analysis of facial appearance
Author
Moriguchi, Junji ; Igarashi, Takanori ; Nakao, Keisuke ; Chen, Yen-wei
Author_Institution
Grad. Sch. of Sci. & Eng., Ritsumeikan Univ., Kusatsu, Japan
fYear
2010
fDate
23-25 June 2010
Firstpage
652
Lastpage
656
Abstract
We propose a subspace based method for quantitative analysis of facial appearance. We first collect both natural and cosmetic female facial images and then construct a subspace of female facial images using principal component analysis (PCA). We divide the subspace into two subspaces: one is global subspace which is constructed by eigenvectors with larger eigenvalues and another one is local subspace which is constructed by eigenvectors with smaller eigenvalues. Both natural and cosmetic facial images are projected to global subspace and local subspace, respectively. The difference (distance) of the projection between the natural facial image and cosmetic facial image is used as a quantitative measure of make-up effect. We found that the difference (distance) in global subspace represents skin color information and the difference (distance) in local subspace represents skin texture information. The quantitative analysis results are strongly correlated with the results of psychological test.
Keywords
eigenvalues and eigenfunctions; face recognition; image colour analysis; principal component analysis; dual subspaces; eigenvalues; eigenvectors; facial appearance; female facial images; principal component analysis; quantitative analysis; skin color information; Eigenvalues and eigenfunctions; Image analysis; Image color analysis; Image texture analysis; Information analysis; Principal component analysis; Psychology; Shape; Skin; Testing; MaVIQ Quantitative Analysis of facial appearance; cosmetic facial image; dual-subspaces; eigenface; natural facial image; principal component analysis (PCA); psychological test; skin;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering and Data Mining (SEDM), 2010 2nd International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-7324-3
Electronic_ISBN
978-89-88678-22-0
Type
conf
Filename
5542841
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