DocumentCode :
525627
Title :
Dual-subspaces based quantitative analysis of facial appearance
Author :
Moriguchi, Junji ; Igarashi, Takanori ; Nakao, Keisuke ; Chen, Yen-wei
Author_Institution :
Grad. Sch. of Sci. & Eng., Ritsumeikan Univ., Kusatsu, Japan
fYear :
2010
fDate :
23-25 June 2010
Firstpage :
652
Lastpage :
656
Abstract :
We propose a subspace based method for quantitative analysis of facial appearance. We first collect both natural and cosmetic female facial images and then construct a subspace of female facial images using principal component analysis (PCA). We divide the subspace into two subspaces: one is global subspace which is constructed by eigenvectors with larger eigenvalues and another one is local subspace which is constructed by eigenvectors with smaller eigenvalues. Both natural and cosmetic facial images are projected to global subspace and local subspace, respectively. The difference (distance) of the projection between the natural facial image and cosmetic facial image is used as a quantitative measure of make-up effect. We found that the difference (distance) in global subspace represents skin color information and the difference (distance) in local subspace represents skin texture information. The quantitative analysis results are strongly correlated with the results of psychological test.
Keywords :
eigenvalues and eigenfunctions; face recognition; image colour analysis; principal component analysis; dual subspaces; eigenvalues; eigenvectors; facial appearance; female facial images; principal component analysis; quantitative analysis; skin color information; Eigenvalues and eigenfunctions; Image analysis; Image color analysis; Image texture analysis; Information analysis; Principal component analysis; Psychology; Shape; Skin; Testing; MaVIQ Quantitative Analysis of facial appearance; cosmetic facial image; dual-subspaces; eigenface; natural facial image; principal component analysis (PCA); psychological test; skin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering and Data Mining (SEDM), 2010 2nd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-7324-3
Electronic_ISBN :
978-89-88678-22-0
Type :
conf
Filename :
5542841
Link To Document :
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