Title :
PSO based test coverage analysis for event driven software
Author :
Rauf, Abdul ; Ejaz, Naveed ; Abbas, Qamar ; Rehman, Shafiq ur ; Shahid, Arshad ali
Author_Institution :
Nat. Univ. of Comput. & Emerging Sci., Islamabad, Pakistan
Abstract :
Graphical User Interface (GUI) includes graphical objects for certain functionalities and features that will determine the state of the GUI at any time. To ensure that software quality is par excellence, software development organizations have made a lot of efforts to test the software with care. However, the process of the examination of a GUI application requires, a huge effort, because of the complexity of these applications. As a result, these organizations have started to provide various automated testing techniques to achieve this goal. Flow graph of events (control flow graph) is an innovative technology being used in the automated GUI testing. The search for the ultimate guarantee for software quality through the introduction of automated software testing raises a more difficult question of "quantity" of tests necessary to ensure the best results. During automated software testing process, evolutionary algorithms can be used to endow with knowledge about the quality of automated test suite based on preset criterion. Usually this test criterion corresponds to a "coverage function" that measures how much of the automatically generated optimization parameters satisfies the given test criterion. In this paper, we have attempted to exploit the event driven nature of GUI. Based on this nature, we have presented a GUI testing and coverage analysis technique centered on Particle Swarm Optimization (PSO).
Keywords :
Application software; Automatic control; Automatic testing; Evolutionary computation; Flow graphs; Graphical user interfaces; Particle swarm optimization; Programming; Software quality; Software testing; GUI Testing; coverage criterion; event flow; particle swarm optimization; test data;
Conference_Titel :
Software Engineering and Data Mining (SEDM), 2010 2nd International Conference on
Conference_Location :
Chengdu, China
Print_ISBN :
978-1-4244-7324-3
Electronic_ISBN :
978-89-88678-22-0