DocumentCode :
52590
Title :
First Results in Near and Mid IR Lithium Niobate-Based Integrated Optics Interferometer Based on SWIFTS-Lippmann Concept
Author :
Thomas, F. ; Heidmann, S. ; de Mengin, M. ; Courjal, N. ; Ulliac, G. ; Morand, Audrey ; Benech, Ph ; Le Coarer, E. ; Martin, G.
Author_Institution :
Inst. de Planetologie et d´Astrophys. de Grenoble, Grenoble, France
Volume :
32
Issue :
22
fYear :
2014
fDate :
Nov.15, 15 2014
Firstpage :
4338
Lastpage :
4344
Abstract :
High-resolution spectrometers are nowadays achievable in compact devices using integrated optics. The approach developed here consists in obtaining a static interferogram by means of a Fresnel reflection at the waveguide output (Lippmann interference between forward and backward beams) and then sample the fringes by periodically etching the waveguide with transverse nanogrooves, that will collect a negligible part of the flux. We present the first SWIFTS-Lippmann interferometer in the near and mid-infrared, thanks to high form factor grooves obtained by focused ion beam in lithium niobate, which opens the way to electrooptic modulation of the interferogram and thus, sampling on-chip, without any moving part. Possible applications are high-resolution spectroscopy and accurate measurement of effective refractive index of a waveguide. A measurement of the effective group refractive index of the guided mode is presented.
Keywords :
infrared spectra; integrated optics; laser beams; light interference; light interferometry; light reflection; lithium compounds; nanophotonics; niobium compounds; optical fabrication; optical waveguides; refractive index; refractive index measurement; Fresnel reflection; LiNbO3; Lippmann interference; SWIFTS-Lippmann interferometer; backward beams; effective group refractive index measurement; electro-optic modulation; forward beams; fringes; high-resolution spectrometers; high-resolution spectroscopy; ion beam focusing; midinfrared lithium niobate-based integrated optic interferometer; near-infrared lithium niobate-based integrated optic interferometer; transverse nanogrooves; waveguide periodically etching; Indexes; Interference; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Substrates; Integrated optics; interferometry; optical waveguides; spectroscopy;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2014.2353773
Filename :
6891121
Link To Document :
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