Title :
Introduction of Si PERC Rear Contacting Design to Boost Efficiency of Cu(In,Ga)Se
Solar Cells
Author :
Vermang, B. ; Watjen, Jorn Timo ; Frisk, Christopher ; Fjallstrom, V. ; Rostvall, F. ; Edoff, M. ; Salome, Pedro ; Borme, Jerome ; Nicoara, Nicoleta ; Sadewasser, Sascha
Author_Institution :
Dept. of Eng. Sci., Uppsala Univ., Uppsala, Sweden
Abstract :
Recently, Cu(In,Ga)Se2 (CIGS) solar cells have achieved 21% world-record efficiency, partly due to the introduction of a postdeposition potassium treatment to improve the front interface of CIGS absorber layers. However, as high-efficiency CIGS solar cells essentially require long diffusion lengths, the highly recombinative rear of these devices also deserves attention. In this paper, an Al2O3 rear surface passivation layer with nanosized local point contacts is studied to reduce recombination at the standard Mo/CIGS rear interface. First, passivation layers with well-controlled grids of nanosized point openings are established by use of electron beam lithography. Next, rear-passivated CIGS solar cells with 240-nm-thick absorber layers are fabricated as study devices. These cells show an increase in open-circuit voltage (+57 mV), short-circuit current (+3.8 mA/cm2), and fill factor [9.5% (abs.)], compared with corresponding unpassivated reference cells, mainly due to improvements in rear surface passivation and rear internal reflection. Finally, solar cell capacitance simulator (SCAPS) modeling is used to calculate the effect of reduced back contact recombination on high-efficiency solar cells with standard absorber layer thickness. The modeling shows that up to 50-mV increase in open-circuit voltage is anticipated.
Keywords :
aluminium compounds; copper compounds; electron beam lithography; gallium compounds; indium compounds; passivation; point contacts; short-circuit currents; solar cells; ternary semiconductors; Al2O3-Cu(InGa)Se2; CIGS absorber layers; Mo-CIGS rear interface; SCAPS modeling; Si PERC rear contacting design; boost efficiency; diffusion lengths; electron beam lithography; fill factor; high-efficiency CIGS solar cells; nanosized local point contacts; nanosized point openings; open-circuit voltage; postdeposition potassium treatment; rear internal reflection; rear surface passivation layer; rear-passivated CIGS solar cells; reduced back contact recombination effect; short-circuit current; size 240 nm; solar cell capacitance simulator modeling; standard absorber layer thickness; unpassivated reference cells; Aluminum oxide; Lithography; Passivation; Photovoltaic cells; Photovoltaic systems; Silicon; Thin film devices; Al2O3; Cu(In,Ga)Se2; Si; electron beam lithography; local point contacts; nanosized openings; passivated emitter and rear cell (PERC); passivation layer; rear internal reflection; rear surface recombination velocity;
Journal_Title :
Photovoltaics, IEEE Journal of
DOI :
10.1109/JPHOTOV.2014.2350696