• DocumentCode
    526666
  • Title

    Notice of Retraction
    A new Dupuit steady well flow simulation device design and research

  • Author

    Dunfan Ye ; Xifeng Wang ; Jianmei Cheng ; Shunming Shen ; Long Zhang

  • Author_Institution
    Fac. of Mech. & Electron. Inf., China Univ. of Geosci., Wuhan, China
  • Volume
    7
  • fYear
    2010
  • fDate
    9-11 July 2010
  • Firstpage
    405
  • Lastpage
    408
  • Abstract
    Notice of Retraction

    After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

    We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

    The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

    With the rapid development of electronic technology advances, electronic technology is now applied to all walks of life. This paper, based on analogy theoretical principles of water & electricity, a new Dupuit steady well flow simulator is prensented. It is applied to the process of “groundwater dynamics” teaching experiment. It is studied and designed by electronic automation control technology to solve the existing physical model of Dupuit that has many issues. After extensive laboratory tests validated, the device if used in modern “groundwater dynamics” teaching experiment, which can make the teaching operation facilitate and feasible, and the experiment result is not only intuitive but also easy to understand. It can improve teaching efficiency well.
  • Keywords
    groundwater; hydrological equipment; Dupuit steady well flow simulation device design; electronic automation control technology; electronic technology; groundwater dynamics teaching experiment; ISO standards; auto-control; design; model; simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5537-9
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2010.5564833
  • Filename
    5564833