DocumentCode :
527085
Title :
Notice of Retraction
DNA damage, copper distribution and element contents in wheat exposed to copper
Author :
Dai-Jing Zhang ; Chun-Xi Li ; Zhi-Juan Zhang ; Li-Na Jiang ; Yun Shao
Author_Institution :
Coll. of Agronomy & Biotechnol., China Agric. Univ., Beijing, China
Volume :
3
fYear :
2010
fDate :
17-18 July 2010
Firstpage :
522
Lastpage :
525
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

The DNA damage and subcellular of copper (Cu) in 8-day-exposure winter wheat (Triticum aestivum L.) were studied to determine Cu genotoxicity mechanisms and compartmentalization. The results showed Cu induced DNA damage significantly in all treated plants, roots are more cytotoxic and genotoxic than shoots. The translocation factors (ratio of Cu concentrations in shoots to those in roots) were from 0.1 to 0.24 with different Cu treatment. Cu concentrations in the different subcellular fractions increased in shoots and roots with the increase of exogenous Cu. Cu was mostly bound to the cell wall of roots while litter Cu was found in the Cell organelle fraction. Further more, excess Cu inhabited the absorption of many nutrition elements such as K, Ca, Mn, Zn and B in wheat seedlings.
Keywords :
DNA; agriculture; copper; toxicology; Cu; Cu genotoxicity; DNA damage; Triticum aestivum L; copper distribution; cytotoxic; element contents; wheat seedlings; winter wheat; Copper; DNA; Ions; Cu; DNA damage; Nutrition contents; Subcellular distribution; Winter wheat;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Science and Information Application Technology (ESIAT), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-7387-8
Type :
conf
DOI :
10.1109/ESIAT.2010.5568289
Filename :
5568289
Link To Document :
بازگشت