DocumentCode :
528058
Title :
Physical effects of avalanche CMOS photodiodes
Author :
Chan, Chieh Ning ; Chen, Oscal T.-C.
Author_Institution :
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Ming-Hsiung, Taiwan
fYear :
2010
fDate :
5-9 July 2010
Firstpage :
824
Lastpage :
825
Abstract :
Three photodiodes of P-diffusion_N-well_P-substrate, N-well_P-substrate, N-diffusion_P-substrate photodiodes using the TSMC 0.35μm CMOS technology are implemented to understand their breakdown voltages at the Geiger mode. The measured results reveal that a photodiode with a larger perimeter yields a lower breakdown voltage. N-well_P-substrate and N-diffusion_P-substrate photodiodes have the largest breakdown voltage and the best current gain, respectively. Particularly, the electrical fields associated with photodiode´s structures are theoretically derived to support the measured results. The results from our experiments can be beneficial to the photodiode design of a 3D image sensor.
Keywords :
CMOS image sensors; avalanche breakdown; avalanche photodiodes; substrates; 3D image sensor; Geiger mode; N-diffusion_P-substrate photodiodes; N-well_P-substrate photodiodes; P-diffusion_N-well_P-substrate photodiodes; TSMC technology; avalanche CMOS photodiodes; breakdown voltage; current gain; size 0.35 mum; Breakdown voltage; CMOS integrated circuits; CMOS technology; Dark current; P-n junctions; Photodiodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
OptoElectronics and Communications Conference (OECC), 2010 15th
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-6785-3
Type :
conf
Filename :
5588004
Link To Document :
بازگشت